Ion scattering spectroscopy

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• Ion Scattering Spectroscopy — L’Ion scattering spectroscopy est une technique d analyse élémentaire par spectroscopie. Portail de la physique Ce document provient de « Ion scattering spectroscopy ». Catégorie : Spectroscopie …   Wikipédia en Français

• ion scattering spectroscopy — jonų sklaidos spektroskopija statusas T sritis radioelektronika atitikmenys: angl. ion scattering spectroscopy vok. Ionenstreuungsspektroskopie, f rus. ионно рассеивательная спектроскопия, f; спектроскопия ионного рассеяния, f pranc.… …   Radioelektronikos terminų žodynas

• slow ion scattering spectroscopy — lėtųjų jonų sklaidos spektroskopija statusas T sritis radioelektronika atitikmenys: angl. slow ion scattering spectroscopy vok. Spektroskopie der Langsamionenstreuung, f rus. спектроскопия рассеяния медленных ионов, f pranc. spectroscopie de… …   Radioelektronikos terminų žodynas

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• spectroscopy — spectroscopist /spek tros keuh pist/, n. /spek tros keuh pee, spek treuh skoh pee/, n. the science that deals with the use of the spectroscope and with spectrum analysis. [1865 70; SPECTRO + SCOPY] * * * Branch of analysis devoted to identifying… …   Universalium

• Rutherford backscattering spectroscopy — Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science. Sometimes referred to as high energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by… …   Wikipedia

• Static secondary ion mass spectrometry — Static secondary ion mass spectrometry, or static SIMS is a technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or… …   Wikipedia

• Raman spectroscopy — Energy level diagram showing the states involved in Raman signal. The line thickness is roughly proportional to the signal strength from the different transitions. Raman spectroscopy (   …   Wikipedia

• Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… …   Wikipedia

• Raman scattering — or the Raman effect (pronounced: IPA| [rə.mən] ) is the inelastic scattering of a photon. Discovered By Dr. C.V. Raman in liquids and by Grigory Landsberg and Leonid Mandelstam in crystals.When light is scattered from an atom or molecule, most… …   Wikipedia